Platinum Alliance Partner

Embedded Specialty Partner
Hardware-in-the-Loop (HIL) Specialty Partner
Vision Specialty Partner

Bloomy provides products and services for manufacturing functional test, avionics real-time test, battery test and simulation, as well as world-class LabVIEW, TestStand, and VeriStand application development. Typical applications include PCBA functional test; aerospace SIL data systems; avionics and battery hardware-in-the-loop (HIL) test; and rapid development of OEM software. These products and services exemplify the world’s best professional practices. Our quality management system is certified to the ISO 9001:2008 standard. Our test platforms have evolved over years of continuous improvement. Bloomy’s distinguished engineering staff is home to the most NI Certified Architects in the world. We literally wrote the book on best practices for LabVIEW development by publishing our coding standards in The LabVIEW Style Book (Copyright © 2007, PrenticeHall).



Services Offered: Migrations & Upgrades, Software Consulting, System Integration

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Company Info


Established 1991


Years as Alliance




Top Industries








Top Application Areas

Data Acquisition, Generation

Test and Measurement


Digital Buses, Protocols

Embedded Systems



NI Hardware Knowledge

PXI/Modular Instruments

CompactDAQ/Modular DAQ Systems

CompactRIO/Modular Embedded

DMM/SMU/Precision DC

High-speed digital I/O

Single-board RIO/Board-Level Embedded



NI Software Knowledge




LabVIEW Real-Time








Address: 839 Marshall Phelps Road , Windsor, Connecticut United States
Phone: 860-298-9925


Address: 10 Forest Avenue, Suite 120 , Paramus, New Jersey United States
Phone: 201-448-8981

Address: 257 Simarano Drive , Marlborough, Massachusetts United States
Phone: (508) 281-8288




NI Certifications















Company Certifications

ISO 9001

ITAR Compliant

ITAR Registered







Products, Solutions, and Case Studies




Battery Management System (BMS) Test Platform

Our BMS test solutions cover the complete BMS product development lifecycle from benchtop simulation and Hardware-in-the-Loop (HIL) testing, through validation and manufacturing functional test.


Universal Electronic Functional Test Platform

Bloomy’s UTS platform combines modular hardware and software to provide a powerful, cost-effective solution for low-medium volume, high-mix functional testing of printed circuit board assemblies.


NI Hardware-In-the-Loop (HIL) Test System

The NI HIL Test System incorporates NI platforms and architectures along with Bloomy transducer simulation modules and interconnects to provide cost-effective real-time test solutions.


Battery HIL System

Bloomy's Battery Hardware-in-the-Loop (HIL) Simulation System provides a safe and efficient method for battery manufacturers and automotive companies to evaluate battery management systems (BMSs) for hybrid and electric vehicles.


Curve Trace System

Bloomy's Curve Trace System utilizes the latest hardware and software technologies to provide a high density, high speed, fully automated IC characterization system. Standard voltage-current curves can be generated for any combination of pins to characterize a large assortment of ICs and other semiconductor devices.


Centrifuge Data Acquisition System

By applying appropriate data acquisition techniques, the stresses and response of a geotechnical system can be verified throughout a model. This includes measurements in the ground at different locations, the movement of a structure, and video imagery of a sequence of events leading to seismic event.


Universal Test System (UTS)

A proven and flexible functional test platform to assess mixed signal PCBA and subassemblies. DUT specific fixtures are mass interconnected to the PXI instrumentation base, allowing high-mix production environments to reuse its test instrumentation under the control of a TestStand test executive.




Hardware Products

compactUTS (cUTS)

A small functional test product that packs a DMM, DAQ, switching and power control into a desktop package that employs a mass interconnect cable to a PCBA or subassembly under test. Attach a standard PC via USB to control the cUTS via LabVIEW or TestStand.


MIL-STD-1553B C-Series Module

Bloomy’s 1553B C Series module provides MIL-STD-1553B communication functionality in a rugged National Instruments (NI) CompactRIO form factor. The module includes a single dual-redundant bus interface that can operate in bus controller, remote terminal, and bus monitor modes.


Battery Simulator 1200

Provides a safe and efficient method to emulate a broad range of battery cell conditions with 12 independently controlled channels of high accuracy simulated cell outputs (5V, ±500mA, 0.1%) that are isolated up to 1000VDC. Multiple simulators can be connected in series to simulate a full EV battery pack.


Software Products

Class Creator Utility

The Bloomy Class Creator Utility streamlines the process of defining, creating and configuring a LabVIEW class in the native environment easily from a single location.


EFT Module for TestStand

The Bloomy Electronics Functional Test (EFT) Module for TestStand is a set of tools for electronics functional test sequence development, execution, and result processing using TestStand.



Case Studies

A Flexible, Cost-Effective BMS Manufacturing Test Platform

A flexible, cost-effective production test system for several designs of battery balancing, monitoring, and management system (BMS) printed circuit board assemblies. BMS test system requirements include simulating a pack of advanced chemistry batteries, performing high accuracy voltage and current measurements, and communicating with the BMS under test via serial and/or CAN.


Energy Storage Testing Enables Distributed Technologies on the Power Grid

Bloomy’s ESS DAC System executes a variety of functional, performance, life cycle, and application-specific tests to validate distributed energy storage (DES) specifications for rating, capacity and efficiency.


Headless ATE System

Bloomy’s Headless ATE is an automated test platform that is extremely simple to operate and does not require a PC. It consists of a 3U enclosure containing NI Single-Board RIO with LabVIEW software, a power supply, and preexisting commercial-off-the-shelf (COTS) test instruments.


Automated Resistance Mapping of LGA Chip Module Contact Grid

System verifies uniform force distribution and quality of electrical connectivity on a pressurized land grid array (LGA) interposer and automates a time-consuming and physically prohibitive process involving substantial measurement, data recording, and data presentation.



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*Information supplied on this page is provided by the partner and has not been verified by NI


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