Automated semiconductor reliability test system IOL & Power cycling

Solution by: SET GmbH

Our IOL (Intermittent Operational Life) & Power Cycling systems increase measurement quality & throughput while reducing the Total Cost of Test of an open platform.

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The IOL & Power Cycling test systems perform long-term durability tests for power semiconductor components (e.g. MOSFETS or IGBTs). During the tests, up to 80 DUTs (10 groups simultaneously) will be stressed periodically with a free programmable load current pulse. The NI TestStand controls thereby the parameter handling and network communication to the embedded sbRIO platform while an online analysis routine discusses the pass/fail criteria for each DUT. Due to the modular design, the automated test systems are adaptable for various purposes and number of devices under test as well as a high throughput of each system can be achieved. We focus thereby on complete monitoring and precise specification of all parameters for each device under test.

  • Parallel tests with up to 80 DUTs
  • Load current up to 500A (IOL) / 1500A (PC)
  • Measurement current up to +/- 50mA
  • 80 measurements points for Tj, Tc, UF, UG, UDS, UEC, Rth
  • Real-time architecture with NI sbRIO (RT & FPGA)
  • Online result analysis for pass/fail criteria integrated
  • Cooling of the DUTs with nitrogen, air or fluid based cool plates
  • 100% monitoring of devices under test
  • High throughput of each system due to compact design and active cooling
  • Fully automated test process
  • Automated test continuation according to characterization
  • Modular design allows for easy expansion
  • Freely programmable test system based on National Instruments┬┤ COTS platform
  • High-precision timing via FPGA technology
  • Adaptable for various purposes and number of devices under test
NI System Content
  • sbRIO / SOM
  • cRIO Modules
  • TestStand
  • LabVIEW
  • LabVIEW RT
  • DIAdem
  • PXI

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