Automated semiconductor reliability test system HTRB & H3TRB

Solution by: SET GmbH


Our HTRB (High Temperature Reverse Bias) & H3TRB systems increase measurement quality & throughput while reducing the Total Cost of Test of an open platform.
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The HTRB & H3TRB test systems perform long-term durability tests for power semiconductor components (e.g. MOSFETS or IGBTs). During the tests, high voltage is applied in reverse direction to the DUTs (up to 240 DUTs, 6 groups simultaneously). The NI TestStand controls thereby the parameter handling and network communication to the embedded sbRIO platform while an online analysis routine discusses the pass/fail criteria for each DUT. Due to the modular design, the automated test systems are adaptable for various purposes and number of devices under test as well as a high throughput of each system can be achieved. We focus thereby on complete monitoring and precise specification of all parameters for each device under test.

Features
  • Parallel tests with up to 240 DUTs
  • Up to 6 controllable power sources – 50V to 2000V
  • Adjustable Temperature Range – 50-250 °C
  • Reverse Bias Current measurement per DUT
  • Single DUT control
  • Integrated safety system
  • SQL database adapter
Benefits
  • Fewer climate chambers due to high numbers of DUTs tested simultaneously
  • No test interruptions due to defective DUTs
  • High throughput for each system due to compact design
  • Several different tests possible within one test run
  • Complete logging of all devices under test during the complete test phase
  • Fully automated test process
  • Automated test continuation according to characterization
  • Freely programmable test system based on National Instruments´ COTS platform
NI System Content
  • sbRIO/SOM
  • cRIO Modules
  • TestStand
  • LabVIEW
  • LabVIEW RT
  • LabVIEW FPGA
  • DIAdem
  • PXI

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