Automated semiconductor chip based handling Test System

Solution by: Amfax Limited


Amfax designed, built, commissioned and installed twelve automated chip based handling Test Systems throughout Europe and the USA.
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The systems serviced four (4) input / output chip trays that carried 396 devices each with a maximum of 1584 devices that could be loaded at the start of a test run. Various application specific, special to type mechanisms were required, these include; waffle tray mounting, vision system for UUT recognition and rotation checking, UUT pre-stage for precision location, temperature controlled pedestal assembly, precision probing assembly, Fibre / Sphere mounting/handling, fully integrated safety and clean cell, operator interface, Mass Connect Interface all integrated into a 19” rack assembly.

Features
Benefits
  • The integration of NI LabVIEW and iMAQ
  • kelvin probing was used for testing the chip
  • Waffle tray mounting
NI System Content
  • NI Vision
  • NI Data Acquisition for control
  • NI LabVIEW

Video Demos / Webcasts

Documents and Downloads

Customer Reviews