Escape Prevention

Solution by: Optimal Plus


Escape Prevention comprises a powerful set of deterministic algorithms to address test process and operational issues to prevent test escapes

Learn More

Designed for integration in test environments where decisions are taken both in real-time and offline, Escape Prevention from Optimal+ comprises a powerful set of deterministic algorithms to address test process and operational issues in both real-time and offline modes to prevent test escapes in both wafer sort and final test. When suspect dice are identified, they are automatically re-binned with no manual intervention required. Users can also define their own escape prevention rules and automatically publish them to the entire test fleet.

Features
  • Detection of parametric freezes
Benefits
  • Reduce RMAs by up to 50%
  • Automatic bin-switching for suspect dice
NI System Content

Video Demos / Webcasts

Documents and Downloads

Customer Reviews