Designed for integration in test environments where decisions are taken both in real-time and offline, Escape Prevention from Optimal+ comprises a powerful set of deterministic algorithms to address test process and operational issues in both real-time and offline modes to prevent test escapes in both wafer sort and final test. When suspect dice are identified, they are automatically re-binned with no manual intervention required. Users can also define their own escape prevention rules and automatically publish them to the entire test fleet.
- Detection of parametric freezes
- Reduce RMAs by up to 50%
- Automatic bin-switching for suspect dice