Automated semiconductor reliability test system IOL & Power cycling
Our IOL (Intermittent Operational Life) & Power Cycling systems increase measurement quality & throughput while reducing the Total Cost of Test of an open platform.
The IOL & Power Cycling test systems perform long-term durability tests for power semiconductor components (e.g. MOSFETS or IGBTs). During the tests, up to 80 DUTs (10 groups simultaneously) will be stressed periodically with a free programmable load current pulse. The NI TestStand controls thereby the parameter handling and network communication to the embedded sbRIO platform while an online analysis routine discusses the pass/fail criteria for each DUT. Due to the modular design, the automated test systems are adaptable for various purposes and number of devices under test as well as a high throughput of each system can be achieved. We focus thereby on complete monitoring and precise specification of all parameters for each device under test.