Automated semiconductor reliability test system HTRB & H3TRB

Our HTRB (High Temperature Reverse Bias) & H3TRB systems increase measurement quality & throughput while reducing the Total Cost of Test of an open platform.



The HTRB & H3TRB test systems perform long-term durability tests for power semiconductor components (e.g. MOSFETS or IGBTs). During the tests, high voltage is applied in reverse direction to the DUTs (up to 240 DUTs, 6 groups simultaneously). The NI TestStand controls thereby the parameter handling and network communication to the embedded sbRIO platform while an online analysis routine discusses the pass/fail criteria for each DUT. Due to the modular design, the automated test systems are adaptable for various purposes and number of devices under test as well as a high throughput of each system can be achieved. We focus thereby on complete monitoring and precise specification of all parameters for each device under test.